Jun
3
Structure of Si wire arrays prepared for optical measurements. a, SEM image of a peeled-off, polymer-embedded wire array, viewed upside-down (at 60◦ tilt) to illustrate the order and fidelity of the embedded wires. b, Schematic of the illumination conditions and definition of the incidence angles θx and θy.
Image Credit: Atwater Research Group, Caltech.
Click image for the largest view.
Comments
Feedburner
Reddit
Stumbleupon
